• DocumentCode
    46495
  • Title

    Study of Dynamic After Cavity Interaction in Gyrotrons—Part II: Influence of a Nonuniform Magnetic Field

  • Author

    Roy Choudhury, Amitavo ; D´Andrea, Danilo ; Thumm, Manfred

  • Author_Institution
    Central Electron. Eng. Res. Inst., Pilani, India
  • Volume
    62
  • Issue
    1
  • fYear
    2015
  • fDate
    Jan. 2015
  • Firstpage
    192
  • Lastpage
    199
  • Abstract
    Spurious oscillations, particularly dynamic after cavity interaction (ACI) in high-power gyrotrons gained attention as an influencing factor on the overall gyrotron performance. Numerical investigations are a main pillar for a deeper understanding of this phenomenon. The Karlsruhe Institute of Technology in-house self-consistent, time-dependent self-consistent multimode code was modified to accommodate the influence of an axial variation of the external magnetic field on the after cavity dynamics. Inclusion of the influence of the nonuniform distribution of the magnetic field in the time-dependent gyrotron beam-wave interaction differential equations is necessary to make proper numerical investigations in terms of the appearance of the dynamic ACI particularly in the output waveguide section (uptaper), where the nonuniform distribution of the magnetic field is more significant. We evaluate the importance of this for modeling of three different high-power gyrotron cavities, where partially undesired weak interactions in the up-taper/launcher region have been observed.
  • Keywords
    cyclotron resonance; differential equations; gyrotrons; magnetic fields; ACI; Karlsruhe Institute of Technology; after cavity interaction; beam wave interaction differential equations; high-power gyrotrons; magnetic field nonuniform distribution; spurious oscillations; Cavity resonators; Geometry; Gyrotrons; Magnetic domains; Mathematical model; Oscillators; Radio frequency; After cavity interaction (ACI); beam-wave interaction; electron cyclotron resonance heating; gyrotron; magnetic field variation; magnetic field variation.;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2014.2367314
  • Filename
    6960878