• DocumentCode
    464960
  • Title

    Temperature-Robust Performance Yield through Supply Voltage Selection

  • Author

    Wolpert, David ; Ampadu, Paul

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Rochester Univ., NY
  • fYear
    2007
  • fDate
    27-30 May 2007
  • Firstpage
    2279
  • Lastpage
    2282
  • Abstract
    In nanoscale system design, increased susceptibility to variation makes robustness an important concern, along with speed and power. To consider robustness amidst variations, fixed performance parameters can be replaced with their distributions during the design process. In this paper, supply voltage selection is used to manage the trade-offs among speed, power, and temperature robustness. Optimal supply voltages are found for different performance goals by considering the variance of the design as well as the mean performance. Furthermore, overall design margins can be increased by finding the best combinations of means and variances in each design decision.
  • Keywords
    power aware computing; power supply circuits; temperature control; supply voltage selection; temperature-robust performance yield; Delay; Process design; Robustness; Space technology; Temperature control; Temperature dependence; Temperature distribution; Temperature sensors; Threshold voltage; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2007. ISCAS 2007. IEEE International Symposium on
  • Conference_Location
    New Orleans, LA
  • Print_ISBN
    1-4244-0920-9
  • Electronic_ISBN
    1-4244-0921-7
  • Type

    conf

  • DOI
    10.1109/ISCAS.2007.378842
  • Filename
    4253129