DocumentCode
464960
Title
Temperature-Robust Performance Yield through Supply Voltage Selection
Author
Wolpert, David ; Ampadu, Paul
Author_Institution
Dept. of Electr. & Comput. Eng., Rochester Univ., NY
fYear
2007
fDate
27-30 May 2007
Firstpage
2279
Lastpage
2282
Abstract
In nanoscale system design, increased susceptibility to variation makes robustness an important concern, along with speed and power. To consider robustness amidst variations, fixed performance parameters can be replaced with their distributions during the design process. In this paper, supply voltage selection is used to manage the trade-offs among speed, power, and temperature robustness. Optimal supply voltages are found for different performance goals by considering the variance of the design as well as the mean performance. Furthermore, overall design margins can be increased by finding the best combinations of means and variances in each design decision.
Keywords
power aware computing; power supply circuits; temperature control; supply voltage selection; temperature-robust performance yield; Delay; Process design; Robustness; Space technology; Temperature control; Temperature dependence; Temperature distribution; Temperature sensors; Threshold voltage; Voltage control;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2007. ISCAS 2007. IEEE International Symposium on
Conference_Location
New Orleans, LA
Print_ISBN
1-4244-0920-9
Electronic_ISBN
1-4244-0921-7
Type
conf
DOI
10.1109/ISCAS.2007.378842
Filename
4253129
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