Title :
Fault Tolerant Signal Processing for Masking Transient Errors in VLSI Signal Processors
Author :
Jenkins, W.K. ; Radhakrishnan, C. ; Pal, S.
Author_Institution :
Dept. of Electr. Eng., Pennsylvania State Univ., University Park, PA
Abstract :
This paper proposes fault tolerant signal processing strategies for achieving reliable performance in VLSI signal processors that are prone to transient errors due to increasingly smaller feature dimensions and supply voltages. The proposed methods are based on residue number system (RNS) coding, involving either hardware redundancy or multiple execution redundancy (MER) strategies designed to identify and overcome transient errors. RNS techniques provide powerful low-redundancy fault tolerance properties that must be introduced at VLSI design levels, whereas MER strategies generally require higher degrees of redundancy that can be introduced at software programming levels.
Keywords :
VLSI; digital signal processing chips; fault tolerance; residue number systems; VLSI design levels; VLSI signal processors; fault tolerant signal processing; hardware redundancy; multiple execution redundancy strategies; residue number system coding; transient errors; Arithmetic; Computer errors; Digital signal processing; Error correction; Fault tolerance; Hardware; Redundancy; Signal processing; Threshold voltage; Very large scale integration;
Conference_Titel :
Circuits and Systems, 2007. ISCAS 2007. IEEE International Symposium on
Conference_Location :
New Orleans, LA
Print_ISBN :
1-4244-0920-9
Electronic_ISBN :
1-4244-0921-7
DOI :
10.1109/ISCAS.2007.377840