Scalable Gate-Level Models for Power and Timing Analysis

In this paper we present a macromodeling methodology to accurately reproduce the timing and the peak/average power behaviors of digital standard cells for a wide range of operating conditions determined by the load, the input transition time, and the supply variations. Our methodology significantly reduces the number of transient simulations for the cell characterization. The numerical results for the transient simulation of large digital systems indicate that we achieve a mean error of 10% for the power consumption and 4% for the propagation delay of the complete digital system while the mean error for the used gates in this system is 2.5% when compared to SPICE-based simulations.