• DocumentCode
    465114
  • Title

    Leakage-based On-Chip Thermal Sensor for CMOS Technology

  • Author

    Ituero, Pablo ; Ayala, José L. ; López-Vallejo, Marisa

  • Author_Institution
    ETSI Telecomunicacion, Ciudad Universitaria, Madrid
  • fYear
    2007
  • fDate
    27-30 May 2007
  • Firstpage
    3327
  • Lastpage
    3330
  • Abstract
    Thermal characterization of ICs and on-chip temperature monitoring have become key tasks in electronic engineering. In this paper, we present the design of an on-chip CMOS temperature sensor based on the temperature dependent characteristics of the subthreshold current. The proposed sensor achieves high accuracy sensing (0.56 degC maximum error), wide temperature range (25-90 degC), and extremely low area (0.010 mm2) and power overhead (18 muW). Our approach improves previous works on on-chip temperature sensors and is highly suitable for portable applications where temperature monitoring achieves great importance.
  • Keywords
    CMOS integrated circuits; integrated circuit measurement; temperature sensors; 18 muW; 25 to 90 C; CMOS technology; electronic engineering; on-chip temperature monitoring; on-chip thermal sensor; thermal characterization; CMOS technology; Leakage current; Sensor phenomena and characterization; Subthreshold current; Temperature dependence; Temperature distribution; Temperature measurement; Temperature sensors; Thermal engineering; Thermal sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2007. ISCAS 2007. IEEE International Symposium on
  • Conference_Location
    New Orleans, LA
  • Print_ISBN
    1-4244-0920-9
  • Electronic_ISBN
    1-4244-0921-7
  • Type

    conf

  • DOI
    10.1109/ISCAS.2007.378223
  • Filename
    4253391