DocumentCode
465114
Title
Leakage-based On-Chip Thermal Sensor for CMOS Technology
Author
Ituero, Pablo ; Ayala, José L. ; López-Vallejo, Marisa
Author_Institution
ETSI Telecomunicacion, Ciudad Universitaria, Madrid
fYear
2007
fDate
27-30 May 2007
Firstpage
3327
Lastpage
3330
Abstract
Thermal characterization of ICs and on-chip temperature monitoring have become key tasks in electronic engineering. In this paper, we present the design of an on-chip CMOS temperature sensor based on the temperature dependent characteristics of the subthreshold current. The proposed sensor achieves high accuracy sensing (0.56 degC maximum error), wide temperature range (25-90 degC), and extremely low area (0.010 mm2) and power overhead (18 muW). Our approach improves previous works on on-chip temperature sensors and is highly suitable for portable applications where temperature monitoring achieves great importance.
Keywords
CMOS integrated circuits; integrated circuit measurement; temperature sensors; 18 muW; 25 to 90 C; CMOS technology; electronic engineering; on-chip temperature monitoring; on-chip thermal sensor; thermal characterization; CMOS technology; Leakage current; Sensor phenomena and characterization; Subthreshold current; Temperature dependence; Temperature distribution; Temperature measurement; Temperature sensors; Thermal engineering; Thermal sensors;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2007. ISCAS 2007. IEEE International Symposium on
Conference_Location
New Orleans, LA
Print_ISBN
1-4244-0920-9
Electronic_ISBN
1-4244-0921-7
Type
conf
DOI
10.1109/ISCAS.2007.378223
Filename
4253391
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