Title :
Leakage-based On-Chip Thermal Sensor for CMOS Technology
Author :
Ituero, Pablo ; Ayala, José L. ; López-Vallejo, Marisa
Author_Institution :
ETSI Telecomunicacion, Ciudad Universitaria, Madrid
Abstract :
Thermal characterization of ICs and on-chip temperature monitoring have become key tasks in electronic engineering. In this paper, we present the design of an on-chip CMOS temperature sensor based on the temperature dependent characteristics of the subthreshold current. The proposed sensor achieves high accuracy sensing (0.56 degC maximum error), wide temperature range (25-90 degC), and extremely low area (0.010 mm2) and power overhead (18 muW). Our approach improves previous works on on-chip temperature sensors and is highly suitable for portable applications where temperature monitoring achieves great importance.
Keywords :
CMOS integrated circuits; integrated circuit measurement; temperature sensors; 18 muW; 25 to 90 C; CMOS technology; electronic engineering; on-chip temperature monitoring; on-chip thermal sensor; thermal characterization; CMOS technology; Leakage current; Sensor phenomena and characterization; Subthreshold current; Temperature dependence; Temperature distribution; Temperature measurement; Temperature sensors; Thermal engineering; Thermal sensors;
Conference_Titel :
Circuits and Systems, 2007. ISCAS 2007. IEEE International Symposium on
Conference_Location :
New Orleans, LA
Print_ISBN :
1-4244-0920-9
Electronic_ISBN :
1-4244-0921-7
DOI :
10.1109/ISCAS.2007.378223