• DocumentCode
    465182
  • Title

    New Power Gating Structure with Low Voltage Fluctuations by Bulk Controller in Transition Mode

  • Author

    Chang, Chung-Yu ; Yang, Wei-Ben ; Huang, Ching-Ji ; Chien, Cheng-Hsing

  • Author_Institution
    SoC Technol. Center, Ind. Technol. Res. Inst., Hsinchu
  • fYear
    2007
  • fDate
    27-30 May 2007
  • Firstpage
    3740
  • Lastpage
    3743
  • Abstract
    System-on-a-chip with multiple power domains reduces leakage power consumption by power gating which shut off the idle blocks. Power gating is an effective technology to reduce sub-threshold leakage current. However, without good understanding and careful design, negative effects of power gating may overwhelm the potential gain and make the technique not worth the effort. For example, power gating may cause instantaneous current when sleep transistors are turned on. And instantaneous current will lead to VDD voltage drop, ground bounce, and inductive noise in power supply line. To reduce the ground bounce, we proposed new power gating structures with added bulk controller when sleep transistors are turned on. Simulation results show that the maximum voltage fluctuations for our power gating structures are smaller than those for the other power gating structures. Our power gating structures reduce the instantaneous current and voltage fluctuations in the power supply line.
  • Keywords
    integrated circuit design; low-power electronics; power consumption; system-on-chip; VDD voltage drop; bulk controller; ground bounce; inductive noise; instantaneous current; leakage power consumption; power gating structure; power supply line; sleep transistors; subthreshold leakage current reduction; system-on-a-chip; voltage fluctuations; CMOS technology; Circuit noise; Circuit simulation; Energy consumption; Leakage current; Low voltage; Power supplies; Switches; Voltage control; Voltage fluctuations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2007. ISCAS 2007. IEEE International Symposium on
  • Conference_Location
    New Orleans, LA
  • Print_ISBN
    1-4244-0920-9
  • Electronic_ISBN
    1-4244-0921-7
  • Type

    conf

  • DOI
    10.1109/ISCAS.2007.378656
  • Filename
    4253494