DocumentCode :
465256
Title :
IPR: An Integrated Placement and Routing Algorithm
Author :
Pan, Min ; Chu, Chris
Author_Institution :
Cadence Design Syst. Inc., San Jose
fYear :
2007
fDate :
4-8 June 2007
Firstpage :
59
Lastpage :
62
Abstract :
In nanometer-scale VLSI technologies, several interconnect issues like routing congestion and interconnect delay have become the main concerns in placement. However, all previous placement approaches optimize some very primitive interconnect models during placement. These models are far from the actual interconnect implementation in the routing stage. As a result, placement solution considered to be good by primitive interconnect models may turn out to be poor after routing. In addition, the placement may not even be routable and timing closure may not be achievable. In this paper, we propose to address the inconsistency between the placement and routing objectives by fully integrating global routing into placement. As a first attempt to this novel approach, we focus on routability issue. We call the proposed algorithm for routing congestion minimization IPR (integrated placement and routing). To ensure the algorithm to be computationally efficient, efficient placement and routing algorithms FastPlace, FastDP and FastRoute are integrated, and well-designed methods are proposed to integrate them efficiently and effectively. Experimental results show that IPR reduces overflow by 36%, global routing wirelength by 3.6%, and runtime by 36% comparing to ROOSTER, which is the previous best academic routability- driven placer.
Keywords :
VLSI; integrated circuit design; integrated placement; interconnect delay; nanometer-scale VLSI technology; routing algorithm; routing congestion; routing congestion minimization; Algorithm design and analysis; Annealing; Delay; Intellectual property; Iterative algorithms; Minimization methods; Routing; Runtime; Timing; Very large scale integration; Algorithms; Design; Integration; Performance; Placement; Routing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2007. DAC '07. 44th ACM/IEEE
Conference_Location :
San Diego, CA
ISSN :
0738-100X
Print_ISBN :
978-1-59593-627-1
Type :
conf
Filename :
4261144
Link To Document :
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