• DocumentCode
    465264
  • Title

    Skewed Flip-Flop Transformation for Minimizing Leakage in Sequential Circuits

  • Author

    Seomun, Jun ; Kim, Jaehyun ; Shin, Youngsoo

  • Author_Institution
    KAIST, Daejeon
  • fYear
    2007
  • fDate
    4-8 June 2007
  • Firstpage
    103
  • Lastpage
    106
  • Abstract
    Mixed Vt has been widely used to control leakage without affecting circuit performance. However, current approaches target the combinational circuits even though sequential elements, such as flip-flops, contribute an appreciable proportion of the total leakage. A skewed flip-flop (SFF) is obtained by slightly increasing the gate length of a subset of the transistors in a conventional flip-flop. The resulting SFF will exhibit very skewed characteristics in terms of leakage and delay, which depend on the transistors that are replaced. We present an algorithm that selectively substitutes SFFs for conventional flip-flops in sequential circuits, such that the timing constraint is still satisfied while the leakage from the flip-flops is reduced. When combined with the mixed Vt technique, an average leakage saving of 16% is achieved, compared to the use of mixed Vt alone.
  • Keywords
    flip-flops; sequential circuits; leakage minimization; sequential circuits; sequential elements; skewed flip-flop transformation; Algorithm design and analysis; Circuit optimization; Combinational circuits; Delay; Flip-flops; Leakage current; MOSFET circuits; Sequential circuits; Threshold voltage; Timing; Algorithms; Design; Flip-flop; leakage current; mixed Vt; sequential circuit;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2007. DAC '07. 44th ACM/IEEE
  • Conference_Location
    San Diego, CA
  • ISSN
    0738-100X
  • Print_ISBN
    978-1-59593-627-1
  • Type

    conf

  • Filename
    4261152