DocumentCode :
465270
Title :
Interdependent Latch Setup/Hold Time Characterization via Euler-Newton Curve Tracing on State-Transition Equations
Author :
Srivastava, Shweta ; Roychowdhury, Jaijeet
Author_Institution :
Univ. of Minnesota, Minneapolis
fYear :
2007
fDate :
4-8 June 2007
Firstpage :
136
Lastpage :
141
Abstract :
Interdependent characterization of latch setup/hold times is a core component of techniques for pessimism reduction via Setup/Hold Interdependence Aware Static Timing Analysis (SHIA-STA) [1], [2]. We present an efficient and novel method for such characterization, by formulating the interdependent setup-hold time problem as an underdetermined nonlinear equation h(zetas,zetah) = 0, which we derive from the latch´s state-transition function. We solve this equation numerically using a Moore-Penrose Newton method. Further, we use null-space information from the Newton´s Jacobian matrix to efficiently find constant-clock-to-Q contours (in the setup/hold time plane), via an Euler-Newton curve tracing procedure. We validate the method on TSPC and C2MOS registers, obtaining speedups of more than 20 x over prior approaches while achieving superior accuracy. This speedup increases linearly with the precision with which curve tracing is desired. In view of the importance and large computational expense of latch characterization in industry today, the new technique represents a significant enabling technology for dramatically speeding up industrial timing closure flows.
Keywords :
CMOS integrated circuits; Newton method; nonlinear equations; Euler-Newton curve tracing; Moore-Penrose Newton method; nonlinear equation; pessimism reduction; setup-hold interdependence aware static timing analysis; state-transition equations; Algorithm design and analysis; Clocks; Computational modeling; Computer industry; Delay; Integrated circuit technology; Latches; Nonlinear equations; Registers; Timing; Algorithms; Characterization; Euler-Newton; Hold time; Interdependence; Setup time;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2007. DAC '07. 44th ACM/IEEE
Conference_Location :
San Diego, CA
ISSN :
0738-100X
Print_ISBN :
978-1-59593-627-1
Type :
conf
Filename :
4261159
Link To Document :
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