DocumentCode
465272
Title
SBPOR: Second-Order Balanced Truncation for Passive Order Reduction of RLC Circuits
Author
Yan, Boyuan ; Tan, Sheldon X D ; Liu, Pu ; McGaughy, Bruce
Author_Institution
Univ. of California, Riverside
fYear
2007
fDate
4-8 June 2007
Firstpage
158
Lastpage
161
Abstract
RLC circuits have been shown to be better formulated as second-order systems instead of first-order systems. The corresponding model order reduction techniques for second- order systems have been developed. However, existing techniques are mainly based on moment-matching concept. While suitable for the reduction of large-scale circuits, those approaches cannot generate reduced models as compact as desired. To achieve smaller models with better error control, a novel technique, SBPOR (Second-order Balanced truncation for Passive Order Reduction), is proposed in this paper, which is the first second-order balanced truncation method proposed for passive reduction of RLC circuits. SBPOR is superior to the pioneering work in the control community because second-order systems can be balanced via congruency transformation without any accuracy loss. In addition, compared with the first-order balanced truncation approaches, SBPOR is a better choice for RLC reduction. SBPOR preserves not only passivity but also the structure information inherent to RLC circuits, which is a special need for RLC reduction. In addition, SBPOR is computationally more efficient as it only needs to solve one linear matrix equation instead of two quadratic matrix equations.
Keywords
RLC circuits; RLC circuits; model order reduction; moment-matching concept; passive order reduction; second-order balanced truncation; Circuit simulation; Complexity theory; Computational modeling; Control systems; Equations; Error correction; Large-scale systems; Permission; RLC circuits; Symmetric matrices; Algorithms; Model order reduction; second-order balanced truncation;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2007. DAC '07. 44th ACM/IEEE
Conference_Location
San Diego, CA
ISSN
0738-100X
Print_ISBN
978-1-59593-627-1
Type
conf
Filename
4261163
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