DocumentCode :
465272
Title :
SBPOR: Second-Order Balanced Truncation for Passive Order Reduction of RLC Circuits
Author :
Yan, Boyuan ; Tan, Sheldon X D ; Liu, Pu ; McGaughy, Bruce
Author_Institution :
Univ. of California, Riverside
fYear :
2007
fDate :
4-8 June 2007
Firstpage :
158
Lastpage :
161
Abstract :
RLC circuits have been shown to be better formulated as second-order systems instead of first-order systems. The corresponding model order reduction techniques for second- order systems have been developed. However, existing techniques are mainly based on moment-matching concept. While suitable for the reduction of large-scale circuits, those approaches cannot generate reduced models as compact as desired. To achieve smaller models with better error control, a novel technique, SBPOR (Second-order Balanced truncation for Passive Order Reduction), is proposed in this paper, which is the first second-order balanced truncation method proposed for passive reduction of RLC circuits. SBPOR is superior to the pioneering work in the control community because second-order systems can be balanced via congruency transformation without any accuracy loss. In addition, compared with the first-order balanced truncation approaches, SBPOR is a better choice for RLC reduction. SBPOR preserves not only passivity but also the structure information inherent to RLC circuits, which is a special need for RLC reduction. In addition, SBPOR is computationally more efficient as it only needs to solve one linear matrix equation instead of two quadratic matrix equations.
Keywords :
RLC circuits; RLC circuits; model order reduction; moment-matching concept; passive order reduction; second-order balanced truncation; Circuit simulation; Complexity theory; Computational modeling; Control systems; Equations; Error correction; Large-scale systems; Permission; RLC circuits; Symmetric matrices; Algorithms; Model order reduction; second-order balanced truncation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2007. DAC '07. 44th ACM/IEEE
Conference_Location :
San Diego, CA
ISSN :
0738-100X
Print_ISBN :
978-1-59593-627-1
Type :
conf
Filename :
4261163
Link To Document :
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