DocumentCode :
465325
Title :
Fast, Non-Monte-Carlo Estimation of Transient Performance Variation Due to Device Mismatch
Author :
Kim, Jaeha ; Jones, Kevin D. ; Horowitz, Mark A.
Author_Institution :
Rambus Inc., Los Altos
fYear :
2007
fDate :
4-8 June 2007
Firstpage :
440
Lastpage :
443
Abstract :
This paper describes a noise-based method of estimating the effects of device random mismatch on circuit´s transient response, such as delay and frequency. The proposed method models DC mismatch as equivalent AC pseudo-noise and exploits the fast periodic noise analysis (PNOISE) available in RF circuit simulators to compute the resulting variation in the circuit response. While the method relies on Gaussian mismatch distributions and linear perturbation model, it can model and analyze correlations as well as identify the most sensitive design parameter to mismatches with no additional simulation cost. Three benchmarks measuring the variations in the input offset voltage of a comparator, the delay of a logic path, and the frequency of an oscillator demonstrate the speed improvement of 100-1000x compared to a 1000-point Monte-Carlo method.
Keywords :
Gaussian distribution; integrated circuit noise; transient response; AC pseudo-noise; DC mismatch; Gaussian mismatch distributions; RF circuit simulators; circuit transient response; comparator; device random mismatch; linear perturbation model; oscillator; periodic noise analysis; Analytical models; Circuit analysis computing; Circuit noise; Circuit simulation; Computational modeling; Delay effects; Delay estimation; Frequency estimation; Radio frequency; Transient response; Algorithms; Design; Mismatch; Monte-Carlo analysis; Simulation; Variability; Yield;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2007. DAC '07. 44th ACM/IEEE
Conference_Location :
San Diego, CA
ISSN :
0738-100X
Print_ISBN :
978-1-59593-627-1
Type :
conf
Filename :
4261223
Link To Document :
بازگشت