DocumentCode
465341
Title
Critical-Path-Aware X-Filling for Effective IR-Drop Reduction in At-Speed Scan Testing
Author
Wen, Xiaoqing ; Miyase, Kohei ; Suzuki, Tatsuya ; Kajihara, Seiji ; Ohsumi, Yuji ; Saluja, Kewal K.
Author_Institution
Kyushu Inst. of Technol., Iizuka
fYear
2007
fDate
4-8 June 2007
Firstpage
527
Lastpage
532
Abstract
IR-drop-induced malfunction is mostly caused by timing violations on activated critical paths during the capture cycle of at-speed scan testing. A critical-path-aware X-filling method is proposed for reducing IR-drop, especially on gates that are close to activated critical paths, thus effectively preventing test-induced yield loss.
Keywords
computer testing; IR-drop reduction; IR-drop-induced at-speed scan testing; critical-path-aware X-filling; Automatic test pattern generation; Circuit testing; Clocks; Integrated circuit reliability; Integrated circuit yield; Logic testing; RLC circuits; Research and development; Switching circuits; Timing; Algorithms; At-Speed Scan Testing; Critical Path; Design; IR-Drop; Reliability; Test Generation; Test-Induced Yield Loss; X-Filling;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2007. DAC '07. 44th ACM/IEEE
Conference_Location
San Diego, CA
ISSN
0738-100X
Print_ISBN
978-1-59593-627-1
Type
conf
Filename
4261240
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