DocumentCode :
465372
Title :
Efficient Modeling Techniques for Dynamic Voltage Drop Analysis
Author :
Harizi, Hedi ; Häubler, Robert ; Olbrich, Markus ; Barke, Erich
Author_Institution :
Qimonda AG, Munich
fYear :
2007
fDate :
4-8 June 2007
Firstpage :
706
Lastpage :
711
Abstract :
Since the IC technology scales down the effect of voltage drop/ground bounce becomes increasingly significant. Voltage drop and ground bounce can compromise the gate driving capability and degrade the IC performance, and even can cause IC functional failures. Hence, it is crucial to capture this effect efficiently and accurately in order to improve circuit reliability. In this paper, we propose efficient modeling techniques for analyzing power distribution in deep sub micron (DSM) ASIC designs. Current source-based model (CSM) and voltage controlled resistor (VCR) are the key concepts in our approach. A basic prerequisite for the new approach are CMOS standard libraries that are pre-characterized with respect to the corresponding modeling requirements. This paper also presents an approach for this characterization step. The proposed techniques can efficiently handle multiple-input-switching (MIS), including single-input-switching events (SIS) and provide good analysis results compared to the reference with two orders of magnitude speedup, although the cell library pre-characterization is based on SPICE simulations. Our model is independent of the power network context, which implies that different power distribution networks may be analyzed based on the same model and the same cell characterizations. The run-time, memory and accuracy efficiency of the proposed method are demonstrated on an industrial design.
Keywords :
CMOS integrated circuits; application specific integrated circuits; integrated circuit design; integrated circuit reliability; ASIC designs; CMOS; CSM; IC technology; SPICE simulations; VCR; cell library pre-characterization; circuit reliability; current source-based model; deep sub micron; dynamic voltage drop analysis; multiple-input-switching; single-input-switching events; voltage controlled resistor; Application specific integrated circuits; Context modeling; Degradation; Dynamic voltage scaling; Libraries; Power distribution; Resistors; Semiconductor device modeling; Video recording; Voltage control; Algorithms; Measurement; Performance; Voltage drop; cell library characterization; current source model; multiple input switching;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2007. DAC '07. 44th ACM/IEEE
Conference_Location :
San Diego, CA
ISSN :
0738-100X
Print_ISBN :
978-1-59593-627-1
Type :
conf
Filename :
4261274
Link To Document :
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