Title :
Verification Coverage: When is Enough, Enough?
Author :
Bacchini, Francine ; Hu, Alan J. ; Fitzpatrick, Tom ; Ranjan, Rajeev ; Lacey, David ; Tan, Mercedes ; Piziali, Andrew ; Ziv, Avi
Author_Institution :
Francine Bacchini, Inc., San Jose, CA
Abstract :
For EDA users worldwide, the functional verification of complex chips poses a daunting challenge that consumes not just increasingly precious amounts of time, but also limited resources and available budget. The introduction of new tools has driven new powerful new methodologies, and spurred further debate on the issue of coverage interoperability - of heterogeneous verification tools and their respective handling of coverage data. New methodologies hold promise for better decision-making, as does a baseline standard for coverage interoperability. With the various new tools and technologies that have arrived on the scene has come support of flows that can lead to better functional verification decisions and higher quality products.
Keywords :
Computer bugs; Design automation; Electronic design automation and methodology; Formal verification; Graphics; Hardware; Logic design; Permission; Sun; Testing; Coverage; Design; Design Verification; Formal Verification; Functional Simulation; Verification; Verification Test Plan;
Conference_Titel :
Design Automation Conference, 2007. DAC '07. 44th ACM/IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-59593-627-1