DocumentCode
465378
Title
Verification Coverage: When is Enough, Enough?
Author
Bacchini, Francine ; Hu, Alan J. ; Fitzpatrick, Tom ; Ranjan, Rajeev ; Lacey, David ; Tan, Mercedes ; Piziali, Andrew ; Ziv, Avi
Author_Institution
Francine Bacchini, Inc., San Jose, CA
fYear
2007
fDate
4-8 June 2007
Firstpage
744
Lastpage
745
Abstract
For EDA users worldwide, the functional verification of complex chips poses a daunting challenge that consumes not just increasingly precious amounts of time, but also limited resources and available budget. The introduction of new tools has driven new powerful new methodologies, and spurred further debate on the issue of coverage interoperability - of heterogeneous verification tools and their respective handling of coverage data. New methodologies hold promise for better decision-making, as does a baseline standard for coverage interoperability. With the various new tools and technologies that have arrived on the scene has come support of flows that can lead to better functional verification decisions and higher quality products.
Keywords
Computer bugs; Design automation; Electronic design automation and methodology; Formal verification; Graphics; Hardware; Logic design; Permission; Sun; Testing; Coverage; Design; Design Verification; Formal Verification; Functional Simulation; Verification; Verification Test Plan;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2007. DAC '07. 44th ACM/IEEE
Conference_Location
San Diego, CA
ISSN
0738-100X
Print_ISBN
978-1-59593-627-1
Type
conf
Filename
4261281
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