• DocumentCode
    465383
  • Title

    Global Critical Path: A Tool for System-Level Timing Analysis

  • Author

    Venkataramani, Girish ; Budiu, Mihai ; Chelcea, Tiberiu ; Goldstein, Seth C.

  • Author_Institution
    Carnegie Mellon Univ., Pittsburgh
  • fYear
    2007
  • fDate
    4-8 June 2007
  • Firstpage
    783
  • Lastpage
    786
  • Abstract
    An effective method for focusing optimization effort on the most important parts of a design is to examine those elements on the critical path. Traditionally, the critical path is defined at the RTL level, as the longest path in the combinational logic between clocked registers. In this paper, we present a system-level timing analysis technique to define the concept of a global critical path (GCP), for predicting system-level performance. We show how the GCP can be used as a theoretical and practical tool for understanding, summarizing and optimizing the behavior of highly concurrent self-timed circuits. We formally define the GCP and show how it can be constructed using a discrete event model and hardware profiling techniques. The GCP provides valuable insight into the control-path behavior of circuits and in finding system-level bottlenecks. We have incorporated the GCP construction and analysis framework into a high-level synthesis and simulation toolchain, thus enabling complete automation in modeling, analysis and optimization.
  • Keywords
    combinational circuits; network synthesis; clocked registers; combinational logic; concurrent self-timed circuits; discrete event model; global critical path; hardware profiling techniques; system-level bottlenecks; system-level performance; system-level timing analysis; Automatic control; Circuits; Clocks; Control systems; Design optimization; Hardware; Logic; Performance analysis; Registers; Timing; Design; Global critical path; Hardware profiling; Measurement; Performance; System modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2007. DAC '07. 44th ACM/IEEE
  • Conference_Location
    San Diego, CA
  • ISSN
    0738-100X
  • Print_ISBN
    978-1-59593-627-1
  • Type

    conf

  • Filename
    4261289