DocumentCode :
465404
Title :
How Much Can Logic Perturbation Help from Netlist to Final Routing for FPGAs
Author :
Zhou, Catherine L. ; Tang, Wai-Chung ; Lo, Wing-Hang ; Wu, Yu-Liang
Author_Institution :
Chinese Univ. of Hong Kong, Shatin
fYear :
2007
fDate :
4-8 June 2007
Firstpage :
922
Lastpage :
927
Abstract :
One unique property of an FPGA chip is that any logic perturbation inside its Look-Up-Tables (LUTs) is totally area/delay-free. Amongst others, this free LUT-internal resource perturbation can also be used to trade for critical LUT-external logic/wire removals for EDA improvements, an extra flexibility ignored before. Using rewiring technique for such logic perturbations, we show that significant cut-downs upon already excellent results from the state-of-the-art DAOmap mappings and the TVPR place-and-route can still be obtained. This logic perturbation operation can further reduce the number of LUTs by up to 33.7% (avg. 10%) without delay penalty and also reduce critical path delay by up to 31.7% (avg. 11%) without disturbing placement or sacrificing area in the final routing. For delay reduction, under proper rewiring strategy, the CPU time used by rewiring is only 5% of the total run time consumed by TVPR´s placement and routing. This idea of perturbing logic between the free LUT-internal and critical LUT-external circuit resources is simple and proved to be powerful. The encouraging results suggest a new technique for an optimization domain less explored for FPGA design flow.
Keywords :
field programmable gate arrays; logic circuits; logic design; table lookup; FPGA chip; LUT-external circuit; LUT-internal circuit; final routing; logic perturbation; look-up-tables; rewiring strategy; state-of-the-art DAOmap; Automatic test pattern generation; Computer science; Delay effects; Delay estimation; Electronic design automation and methodology; Field programmable gate arrays; Logic circuits; Routing; Table lookup; Wires; ATPG; Design; Experimentation; FPGA; Performance; Routing; Technology mapping;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2007. DAC '07. 44th ACM/IEEE
Conference_Location :
San Diego, CA
ISSN :
0738-100X
Print_ISBN :
978-1-59593-627-1
Type :
conf
Filename :
4261315
Link To Document :
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