Title :
IP Exchange: I´ll Show You Mine if You Show Me Yours
Author :
Sarno, Lauren ; Wilson, Ron ; Eo, Soo-Kwan ; Lestringand, Laurent ; Goodenough, John ; Stark, Guri ; Leef, Serge ; Witt, Dave
Author_Institution :
ARM, Cambridge, UK
Abstract :
Between concept and production, there are many points where hardware and software developers need to exchange requirements and intellectual property. What data models need to be provided in the future? Is the current data sufficient for users to integrate IP in their systems? Who should be defining the standards for IP models and EDA tools? Are the current standards sufficient to build SoCs and ensure users´ success? This panel of IP and EDA vendors and end users will debate these issues.
Keywords :
Cities and towns; Data models; Electronic design automation and methodology; Graphics; Hardware; Instruments; Intellectual property; Permission; Production; Standardization;
Conference_Titel :
Design Automation Conference, 2007. DAC '07. 44th ACM/IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-59593-627-1