DocumentCode :
465496
Title :
A Rail-to-Rail Delay Line for Time Analog-to-Digital Converters
Author :
Keskin, Mustafa
Author_Institution :
Qualcomm Inc., San Diego
Volume :
1
fYear :
2006
fDate :
6-9 Aug. 2006
Firstpage :
461
Lastpage :
464
Abstract :
This paper presents a rail-to-rail, voltage-to-time conversion circuit, which can be used in time-analog-to-digital (TAD) converters. The building block of TAD converters is a number of cascaded inverters, called a delay line. A pulse signal is applied to input of very first inverter of the delay line while an input signal to be digitized is applied to the positive supply terminal (PST) of a delay line. By this way, an input signal, in reality, behaves like a positive supply voltage. This will introduce a variable clock-edge-delay at the output of a delay line defined by the input signal at positive supply terminal. On the other hand, functionality of this earlier method is limited since input signal can not be lower than the threshold voltage of MOS devices in a basic inverter cell. This limitation comes from the fact that full signal range is not possible. Hence, a new architecture is proposed, which basically consists of two sets of delay lines, where an input signal is connected to a positive supply terminal (Vdd) in one set and it is connected to negative supply terminal (Vgnd) in the other set. In this paper, there is also simple digital logic circuit is shown to combine outputs of two sets. Hence, full signal-swing from Vgnd to Vdd can be converted to digital without any significant dead regions.
Keywords :
CMOS logic circuits; analogue-digital conversion; delay lines; logic gates; MOS device; cascaded inverters; digital CMOS process; digital logic circuit; negative supply terminal; positive supply terminal; rail-to-rail delay line; time analog-to-digital converters; variable clock-edge-delay; voltage-to-time conversion circuit; Analog circuits; Analog-digital conversion; Clocks; Delay lines; Logic circuits; MOS devices; Pulse circuits; Pulse inverters; Pulse measurements; Threshold voltage; Delay circuits; analog-to-digital converters; inverters; voltage-to-delay conversion;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2006. MWSCAS '06. 49th IEEE International Midwest Symposium on
Conference_Location :
San Juan
ISSN :
1548-3746
Print_ISBN :
1-4244-0172-0
Electronic_ISBN :
1548-3746
Type :
conf
DOI :
10.1109/MWSCAS.2006.382098
Filename :
4267175
Link To Document :
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