DocumentCode :
465499
Title :
A Comparison Between Noise-Immunity Design Techniques for Dynamic Logic Gates
Author :
Gonzalez-Diaz, O. ; Linares-Aranda, M. ; Mendoza-Hernandez, F.
Author_Institution :
Nat. Inst. for Astrophys., Opt. & Electron., Puebla
Volume :
1
fYear :
2006
fDate :
6-9 Aug. 2006
Firstpage :
484
Lastpage :
488
Abstract :
In this work, we analyze three design techniques to enhance the noise immunity of dynamic logic gates. A comparison in Power Consumption, Average Noise Threshold Energy (ANTE) and ANTE- normalized energy (EANTE) between the three techniques is presented. The dynamic logic gates using noise immunity techniques were designed with 0.35 mum, 0.18 mum, and 0.09 mum CMOS process technologies and power supply of 3.3 V, 1.8 V, and 1.0 V respectively. The obtained results show that for all technologies used in the simulations the Transparency Window technique [1] presents the best trade-off among noise immunity and performance as technology scales.
Keywords :
CMOS logic circuits; integrated circuit noise; logic gates; CMOS process technologies; dynamic logic gates; noise-immunity design techniques; CMOS logic circuits; CMOS technology; Circuit noise; Crosstalk; Energy consumption; Logic circuits; Logic design; Logic gates; Optical noise; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2006. MWSCAS '06. 49th IEEE International Midwest Symposium on
Conference_Location :
San Juan
ISSN :
1548-3746
Print_ISBN :
1-4244-0172-0
Electronic_ISBN :
1548-3746
Type :
conf
DOI :
10.1109/MWSCAS.2006.382104
Filename :
4267181
Link To Document :
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