DocumentCode :
465505
Title :
Aggressive Area Scaling in Passive Transresistance Networks
Author :
Fei, Haibo ; Geiger, Randall L.
Author_Institution :
Dept. of Electrical and Computer Engineering, Iowa State University, Ames, IA U.S.A. 50011
Volume :
1
fYear :
2006
fDate :
6-9 Aug. 2006
Firstpage :
536
Lastpage :
539
Abstract :
the issue of very aggressive area scaling to practically achieve large transresistance in a small amount of area is addressed. Closed form analytical expressions for the area scaling efficiency for an R-2R transresistance network and a ladder-based transresistance network are presented. Closed form analytical expressions and numerical comparisons for the standard deviation of the transresistance of these networks that are useful for determining ratio matching yield are also included.
Keywords :
Active filters; CMOS process; Computer networks; Feedback amplifiers; Frequency; Printed circuits; Resistors; Signal processing; Silicides; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2006. MWSCAS '06. 49th IEEE International Midwest Symposium on
Conference_Location :
San Juan, PR
ISSN :
1548-3746
Print_ISBN :
1-4244-0172-0
Electronic_ISBN :
1548-3746
Type :
conf
DOI :
10.1109/MWSCAS.2006.382117
Filename :
4267194
Link To Document :
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