DocumentCode :
46564
Title :
A Compliant MEMS Device for Out-of-Plane Displacements With Thermo-Electric Actuation
Author :
Vitellaro, Giuseppe ; L´Episcopo, Gaetano ; Trigona, C. ; Ando, B. ; Baglio, S.
Author_Institution :
Dept. of Electr., Electron. & Informatic Eng., Univ. of Catania, Catania, Italy
Volume :
23
Issue :
3
fYear :
2014
fDate :
Jun-14
Firstpage :
661
Lastpage :
671
Abstract :
A MEMS actuator for micrometric displacements in the out-of-plane direction is proposed in this paper. The device is based on a compliant micromechanism composed of a thick layer of nickel and two thin layers of silicon nitride ensuring displacements in the out-of-plane direction. Its actuation is thermo-electrically performed, the polysilicon resistor encapsulated between the two thin silicon nitride layers is heated by Joule effect; the obtained thermo-mechanical deformation is therefore converted into an out of plane displacement thanks to the compliant mechanism realized in the device structure. The behavior of the device has been analytically modeled through the pseudo-rigid body model methodology and simulated with finite elements models in order to study and optimize its performance. The results coming from the presented models and the device operation have been experimentally validated by characterizing a prototype of this device micro-fabricated in the MetalMUMPs process from MEMSCAP. The maximum displacement of the device is ~16 μm with a maximum actuation voltage of 90 V and the maximum exerted force is ~17 mN.
Keywords :
deformation; finite element analysis; microactuators; nickel; silicon compounds; thermoelectric devices; MEMS actuator; MEMSCAP; MetalMUMPs process; Ni; SiN; compliant MEMS device; device structure; finite element models; micrometric displacements; out-of-plane direction; out-of-plane displacements; polysilicon resistor; pseudorigid body model methodology; thermoelectric actuation; thermomechanical deformation; thin silicon nitride layers; Actuators; Finite element analysis; Micromechanical devices; Resistors; Silicon; Thermal expansion; Thermal resistance; Actuators; FEM analyses; MEMS transducers; fully compliant micro-mechanisms; out-of-plane displacements; pseudo-rigid boby model; thermo-electric actuation; thermo-electric actuation.;
fLanguage :
English
Journal_Title :
Microelectromechanical Systems, Journal of
Publisher :
ieee
ISSN :
1057-7157
Type :
jour
DOI :
10.1109/JMEMS.2013.2283520
Filename :
6627923
Link To Document :
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