DocumentCode
4658
Title
An Ambipolar Virtual-Source-Based Charge-Current Compact Model for Nanoscale Graphene Transistors
Author
Rakheja, Shaloo ; Yanqing Wu ; Han Wang ; Palacios, T. ; Avouris, Phaedon ; Antoniadis, Dimitri A.
Author_Institution
Microsyst. Technol. Labs., Massachusetts Inst. of Technol., Cambridge, MA, USA
Volume
13
Issue
5
fYear
2014
fDate
Sept. 2014
Firstpage
1005
Lastpage
1013
Abstract
A compact physics-based ambipolar-virtual-source (AVS) model is presented that describes carrier transport in both unipolar and ambipolar regimes in quasi-ballistic graphene field-effect transistors (GFETs). The transport model incorporates two separate virtual sources for electrons and holes and is supplemented by a self-consistent channel-charge-partitioning model valid from drift-diffusive to ballistic transport conditions. The model comprehends the asymmetry introduced by different contact resistances for electrons and holes. The AVS model has a limited number of parameters, most of which have a physical meaning and can easily be extracted from device characterization. The model has been extensively calibrated with experimental dc I-V and s-parameter measurements of devices with gate lengths from 650 to 40 nm. This has allowed the scaling of mobility and VS source injection velocity of carriers with gate length to be investigated for the first time. The new compact model yields continuous currents and charges and can easily be used in the design and analysis of circuits and systems implemented with GFETs.
Keywords
S-parameters; ballistic transport; contact resistance; electron mobility; field effect transistors; fullerene devices; graphene; hole mobility; nanostructured materials; C; VS source injection velocity; ambipolar virtual-source-based charge-current compact model; carrier mobility; carrier transport; contact resistances; dc I-V measurements; drift-diffusive conditions; gate lengths; nanoscale graphene transistors; quasiballistic graphene field-effect transistors; s-parameter measurements; self-consistent channel-charge-partitioning model; Capacitance; Charge carrier processes; Graphene; Integrated circuit modeling; Logic gates; Mathematical model; Numerical models; Ambipolar transport; capacitance model; charge partitioning; graphene; quasi-ballistic transport; virtual-source model;
fLanguage
English
Journal_Title
Nanotechnology, IEEE Transactions on
Publisher
ieee
ISSN
1536-125X
Type
jour
DOI
10.1109/TNANO.2014.2344437
Filename
6868269
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