DocumentCode
465894
Title
Two New Kinds of Class Level Mutants for Object-Oriented Programs
Author
Chen, Huo Yan ; Hu, Su
Author_Institution
Jinan Univ., Guangzhou
Volume
3
fYear
2006
fDate
8-11 Oct. 2006
Firstpage
2173
Lastpage
2178
Abstract
The mutation testing focuses on the most possible mistakes of the software and so it has high ability to expose mistakes. However, at present it is still mainly used in procedure-oriented program testing. In recent years, object-oriented programming becomes more and more popular. This paper sets up the concepts for two new kinds of class level mutants for object-oriented program testing. One kind is of attribute mutants. The other is of method mutants. The formal description for the concepts is presented and the algorithms for generating attribute mutants and method mutants are proposed in this paper. A tool prototype for the algorithms is implemented and the related testing adequacy is also analyzed.
Keywords
object-oriented methods; program testing; attribute mutants; class level mutants; formal description; mutation testing; object-oriented program testing; procedure-oriented program testing; Algorithm design and analysis; Clustering algorithms; Cybernetics; Genetic mutations; Java; Object oriented programming; Prototypes; Software algorithms; Software testing; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Systems, Man and Cybernetics, 2006. SMC '06. IEEE International Conference on
Conference_Location
Taipei
Print_ISBN
1-4244-0099-6
Electronic_ISBN
1-4244-0100-3
Type
conf
DOI
10.1109/ICSMC.2006.385183
Filename
4274189
Link To Document