• DocumentCode
    465894
  • Title

    Two New Kinds of Class Level Mutants for Object-Oriented Programs

  • Author

    Chen, Huo Yan ; Hu, Su

  • Author_Institution
    Jinan Univ., Guangzhou
  • Volume
    3
  • fYear
    2006
  • fDate
    8-11 Oct. 2006
  • Firstpage
    2173
  • Lastpage
    2178
  • Abstract
    The mutation testing focuses on the most possible mistakes of the software and so it has high ability to expose mistakes. However, at present it is still mainly used in procedure-oriented program testing. In recent years, object-oriented programming becomes more and more popular. This paper sets up the concepts for two new kinds of class level mutants for object-oriented program testing. One kind is of attribute mutants. The other is of method mutants. The formal description for the concepts is presented and the algorithms for generating attribute mutants and method mutants are proposed in this paper. A tool prototype for the algorithms is implemented and the related testing adequacy is also analyzed.
  • Keywords
    object-oriented methods; program testing; attribute mutants; class level mutants; formal description; mutation testing; object-oriented program testing; procedure-oriented program testing; Algorithm design and analysis; Clustering algorithms; Cybernetics; Genetic mutations; Java; Object oriented programming; Prototypes; Software algorithms; Software testing; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Systems, Man and Cybernetics, 2006. SMC '06. IEEE International Conference on
  • Conference_Location
    Taipei
  • Print_ISBN
    1-4244-0099-6
  • Electronic_ISBN
    1-4244-0100-3
  • Type

    conf

  • DOI
    10.1109/ICSMC.2006.385183
  • Filename
    4274189