DocumentCode :
466628
Title :
Academic Development in Test Engineering
Author :
Papalias, Tamara A. ; Gonzalez, R.B. ; Gurtovoy, F.
Author_Institution :
San Jose State Univ., San Jose
fYear :
2006
fDate :
25-28 June 2006
Firstpage :
77
Lastpage :
80
Abstract :
A 2-semester program of lectures and laboratory work in mixed-signal test development engineering has been initiated at San Jose State University. Class one involves bench-top assessment on a specifically-designed printed circuit board to explore basic issues of testing: accuracy, guard bands, repeatability, correlation, and printed circuit board design. Class two revisits many of these issues in off-line and on-line programs for manufacturing testers like Agilent´s 93k. The trade-offs in accuracy versus test time are focal. This paper outlines the courses and presents an example of student ATE lab work.
Keywords :
educational courses; electronic engineering education; printed circuit design; printed circuit testing; Agilent 93k; San Jose State University; mixed-signal test development engineering; printed circuit board design; student ATE lab work; test engineering academic development; Circuit testing; Design engineering; Electrical resistance measurement; Industrial training; Laboratories; Manufacturing; Operational amplifiers; Printed circuits; Signal generators; Software testing; ATE; DSP-based test; design for test (DfT); mixed-signal test; test development;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
University/Government/Industry Microelectronics Symposium, 2006 16th Biennial
Conference_Location :
San Jose, CA
ISSN :
0749-6877
Print_ISBN :
1-4244-0267-0
Type :
conf
DOI :
10.1109/UGIM.2006.4286357
Filename :
4286357
Link To Document :
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