• DocumentCode
    466628
  • Title

    Academic Development in Test Engineering

  • Author

    Papalias, Tamara A. ; Gonzalez, R.B. ; Gurtovoy, F.

  • Author_Institution
    San Jose State Univ., San Jose
  • fYear
    2006
  • fDate
    25-28 June 2006
  • Firstpage
    77
  • Lastpage
    80
  • Abstract
    A 2-semester program of lectures and laboratory work in mixed-signal test development engineering has been initiated at San Jose State University. Class one involves bench-top assessment on a specifically-designed printed circuit board to explore basic issues of testing: accuracy, guard bands, repeatability, correlation, and printed circuit board design. Class two revisits many of these issues in off-line and on-line programs for manufacturing testers like Agilent´s 93k. The trade-offs in accuracy versus test time are focal. This paper outlines the courses and presents an example of student ATE lab work.
  • Keywords
    educational courses; electronic engineering education; printed circuit design; printed circuit testing; Agilent 93k; San Jose State University; mixed-signal test development engineering; printed circuit board design; student ATE lab work; test engineering academic development; Circuit testing; Design engineering; Electrical resistance measurement; Industrial training; Laboratories; Manufacturing; Operational amplifiers; Printed circuits; Signal generators; Software testing; ATE; DSP-based test; design for test (DfT); mixed-signal test; test development;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    University/Government/Industry Microelectronics Symposium, 2006 16th Biennial
  • Conference_Location
    San Jose, CA
  • ISSN
    0749-6877
  • Print_ISBN
    1-4244-0267-0
  • Type

    conf

  • DOI
    10.1109/UGIM.2006.4286357
  • Filename
    4286357