DocumentCode :
467356
Title :
Extension and Application of the Method of Single Expression (MSE) for Analysis of Plane Electromagnetic Wave Oblique Incidence on a Dielectric Slab
Author :
Baghdasaryan, Hovik V. ; Knyazyan, Tamara M. ; Baghdasaryan, Tigran H. ; Eyramjyan, Grigori G.
Author_Institution :
State Eng. Univ. of Armenia, Yerevan
Volume :
1
fYear :
2007
fDate :
1-5 July 2007
Firstpage :
258
Lastpage :
261
Abstract :
An extension of the method of single expression (MSE) for the analysis of plane electromagnetic wave oblique incidence on a dielectric slab is performed. Corresponding Helmholtz´s equation, boundary conditions and the expression for power flow density are derived in the terms of MSE for TE and TM electromagnetic waves. TE wave oblique incidence on a wavelength-scale dielectric slab of low (high) permittivity surrounded by media of high (low) permittivity is analysed. The reflectance peculiarities of the slab and the distribution of electric field amplitude inside it are presented. For a slab of low permittivity surrounded by media of high permittivity the phenomenon of frustrated total internal reflection (FTIR) is observed and analysed.
Keywords :
Helmholtz equations; dielectric materials; electromagnetic waves; Helmholtz equation; dielectric slab; electric field distribution; frustrated total internal reflection; plane electromagnetic wave oblique incidence; power flow density; single expression method; Boundary conditions; Dielectrics; Electromagnetic analysis; Electromagnetic scattering; Equations; Load flow; Performance analysis; Permittivity; Slabs; Tellurium; TE and TM waves; frustrated total internal reflection (FTIR); method of single expression (MSE); numerical simulation; oblique incidence; thin film;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Transparent Optical Networks, 2007. ICTON '07. 9th International Conference on
Conference_Location :
Rome
Print_ISBN :
1-4244-1249-8
Electronic_ISBN :
1-4244-1249-8
Type :
conf
DOI :
10.1109/ICTON.2007.4296083
Filename :
4296083
Link To Document :
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