Title :
3D Challenges and a Non-In-Depth Overview of Recent Progress
Author :
Van Gool, Luc ; Leibe, Bastian ; Müller, Pascal ; Vergauwen, Maarten ; Weise, Thibaut
Author_Institution :
Swiss Fed. Inst. of Technol. (ETH), Zurich
Abstract :
Although a lot of effort already went into the development of 3D acquisition technology, and existing methods come of age, several challenges remain. We try to give a - probably incomplete - overview of these. Then, some of our recent work at ETH Zurich and the University of Leuven is discussed, where we try to tackle such outstanding issues.
Keywords :
data acquisition; solid modelling; three-dimensional displays; 3D acquisition technology; Leuven University; non-in-depth overview; Ceramics; Cities and towns; Context modeling; Cultural differences; Data mining; Glass; Inorganic materials; Navigation; Reflectivity; Textiles;
Conference_Titel :
3-D Digital Imaging and Modeling, 2007. 3DIM '07. Sixth International Conference on
Conference_Location :
Montreal, QC
Print_ISBN :
978-0-7695-2939-4
DOI :
10.1109/3DIM.2007.1
