Identification of Plane Layered Structure from Specified Angular Characteristic of Reflectivity

The solution of the inverse scattering problem (ISP) for oblique incidence of the electromagnetic plane wave on a dielectric layered structure is presented in the paper. The investigation covers a case, where angular dependence of the reflection coefficient is used as initial data. Solution of this problem involves reducing the electromagnetic field equations to a Schrodinger´s one in both cases: the perpendicular and parallel polarized incidence. The determination of unknown permittivity profile is performed by implementation of the Zakharov-Shabat´s inverse scattering procedure to the Schrodinger´s equation inversion.