DocumentCode :
468163
Title :
A Double Layer Bayesian Classifier
Author :
Sun, Jiangwen ; Wang, Chongjun ; Chen, Shifu
Author_Institution :
Nanjing Univ., Nanjing
Volume :
1
fYear :
2007
fDate :
24-27 Aug. 2007
Firstpage :
540
Lastpage :
544
Abstract :
Numerous approaches have been proposed to relax the conditional independence assumption of naive Bayes, the accuracy performance was indeed improved relative to naive Bayes when the assumption is violated. But most of the previous approaches treated the attribute relation in the same way for all class labels. In practice, this relation may be different for different class labels. This paper proposes a novel approach, by which the posterior probability of different class label is evaluated using different attribute relation. Experiment results indicate that the new approach obtains comparative performance relative to other modern Bayesian classifiers on some datasets, and on some other datasets it outperforms the others.
Keywords :
Bayes methods; pattern classification; double layer Bayesian classifier; naive Bayes; posterior probability; Bayesian methods; Classification tree analysis; Decision trees; Laboratories; Probability; Software performance; Statistics; Sun; Testing; Training data;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Fuzzy Systems and Knowledge Discovery, 2007. FSKD 2007. Fourth International Conference on
Conference_Location :
Haikou
Print_ISBN :
978-0-7695-2874-8
Type :
conf
DOI :
10.1109/FSKD.2007.21
Filename :
4405983
Link To Document :
بازگشت