Title :
MSE analyses of thresholding by multiscale product
Author :
Meng, Jin-li ; Jin, Lin ; Pan, Quan ; Zhang, Hong-cai
Author_Institution :
Nanjing Res. Inst. of Electron. Technol., Nanjing
Abstract :
Multiplying adjacent wavelet scales to obtain multiscale product can enhance significant structures and suppress noise, which makes it have predominance over other methods. Starting from the formation mechanism of multiscale product, soft-thresholding of multiscale product is proposed. Furthermore, we examine the mean square error (MSE) characteristics of soft-thresholding and hard-thresholding based on multiscale product coefficient. Finally, we present a measurable rule to choose wavelet bases. Simulation results are consistent with the theoretic analyses.
Keywords :
mean square error methods; noise; signal processing; wavelet transforms; adjacent wavelet scales; hard-thresholding; mean square error characteristics; multiscale product; noise suppression; signal processing; soft-thresholding; Additive noise; Mean square error methods; Noise reduction; Notice of Violation; Pattern analysis; Pattern recognition; Signal processing algorithms; Wavelet analysis; Wavelet coefficients; Wavelet transforms; Denoising; mean square error; mutiscale product; thresholding; wavelet transform;
Conference_Titel :
Wavelet Analysis and Pattern Recognition, 2007. ICWAPR '07. International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-1065-1
Electronic_ISBN :
978-1-4244-1066-8
DOI :
10.1109/ICWAPR.2007.4420795
