MSE analyses of thresholding by multiscale product

Author

Meng, Jin-li ; Jin, Lin ; Pan, Quan ; Zhang, Hong-cai

Author_Institution

Nanjing Res. Inst. of Electron. Technol., Nanjing

Volume

2

fYear

2007

fDate

2-4 Nov. 2007

Firstpage

891

Lastpage

896

Abstract

Multiplying adjacent wavelet scales to obtain multiscale product can enhance significant structures and suppress noise, which makes it have predominance over other methods. Starting from the formation mechanism of multiscale product, soft-thresholding of multiscale product is proposed. Furthermore, we examine the mean square error (MSE) characteristics of soft-thresholding and hard-thresholding based on multiscale product coefficient. Finally, we present a measurable rule to choose wavelet bases. Simulation results are consistent with the theoretic analyses.

Keywords

mean square error methods; noise; signal processing; wavelet transforms; adjacent wavelet scales; hard-thresholding; mean square error characteristics; multiscale product; noise suppression; signal processing; soft-thresholding; Additive noise; Mean square error methods; Noise reduction; Notice of Violation; Pattern analysis; Pattern recognition; Signal processing algorithms; Wavelet analysis; Wavelet coefficients; Wavelet transforms; Denoising; mean square error; mutiscale product; thresholding; wavelet transform;

fLanguage

English

Publisher

ieee

Conference_Titel

Wavelet Analysis and Pattern Recognition, 2007. ICWAPR '07. International Conference on

Conference_Location

Beijing

Print_ISBN

978-1-4244-1065-1

Electronic_ISBN

978-1-4244-1066-8

Type

conf

DOI

10.1109/ICWAPR.2007.4420795

Filename

4420795