DocumentCode :
469368
Title :
Engineered interfaces for enhanced oxidation/corrosion resistance of ultra thin pre-plated leadframes
Author :
Liu, Lilin ; Fu, Ran ; Liu, Deming ; Zhang, Tong-Yi
Author_Institution :
Hong Kong Univ. of Sci. & Technol., Kowloon
fYear :
2006
fDate :
11-14 Dec. 2006
Firstpage :
1
Lastpage :
4
Abstract :
Optimizing the elelctroplating condition, the thickness of a Pd layer in the Au/Pd/Ni/Cu pre-plated leadframe (PPF) is reduced to 8 -10 nm. Introducing a ~10 nm thick dense (Cu,Ni)3Sn intermetallic compound (IMC) layer in the PPF drastically reduces Cu out-diffusion and hence improves significantly the protection of the leadframes against oxidation and corrosion attack. The microstructural characterization results indicate that the success in the development of ultra-thin PPFs with a Ni layer thickness less than 200 nm is attributed to coherent/semi-coherent interfaces between the layers and the Sn-based IMC.
Keywords :
copper alloys; corrosion protective coatings; diffusion barriers; electroplating; gold alloys; lead bonding; nickel alloys; oxidation; palladium alloys; reliability; tin alloys; Au-Pd-Ni-Cu; coherent/semi-coherent interfaces; corrosion protection; engineered interfaces; enhanced oxidation/corrosion resistance; intermetallic compound layer; microstructural characterization; oxidation protection; size 10 nm; ultra thin pre-plated leadframes; Corrosion; Costs; Gold; Lead; Oxidation; Protection; Substrates; Surface morphology; Surface resistance; Tin;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Materials and Packaging, 2006. EMAP 2006. International Conference on
Conference_Location :
Kowloon
Print_ISBN :
978-1-4244-0834-4
Electronic_ISBN :
978-1-4244-0834-4
Type :
conf
DOI :
10.1109/EMAP.2006.4430599
Filename :
4430599
Link To Document :
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