DocumentCode :
469522
Title :
Evaluation of contact resistance of silver-loaded epoxy with aluminized backplane of silicon microstrip sensors
Author :
Kohriki, T. ; Ikegami, Y. ; Unno, Y. ; Terada, S. ; Mochizuki, A. ; Hara, K.
Author_Institution :
Inst. of Particle & Nucl. Studies, Tsukuba
Volume :
1
fYear :
2007
fDate :
Oct. 26 2007-Nov. 3 2007
Firstpage :
673
Lastpage :
676
Abstract :
Some modules of the ATLAS silicon strip detector (SCT) exhibited a significantly higher effective bias resistance than we had expected. About 20 % of the barrel modules, for instance, showed such a resistance of 40 Omegak or higher. We have tried to identify causes of this high resistance as well as to find a remedy if necessary. As for the SCT modules, the bias connection is made with silver-loaded epoxy to the aluminized backplane of the silicon sensors. It was identified that the contact of the silver-loaded epoxy to the surface of the aluminized backplane sometimes provoked the high resistance. Fortunately, however, it automatically cures in practice by applying a usual bias voltage, to become harmlessly small of a few ten ohms.
Keywords :
contact resistance; polymers; position sensitive particle detectors; silicon radiation detectors; silver; ATLAS silicon strip detector; SCT modules; aluminized sensor surface; contact resistance; silicon microstrip sensors; silver-loaded epoxy; Backplanes; Circuits; Contact resistance; Current measurement; Diodes; Electrical resistance measurement; Microstrip; Silicon; Strips; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2007. NSS '07. IEEE
Conference_Location :
Honolulu, HI
ISSN :
1095-7863
Print_ISBN :
978-1-4244-0922-8
Type :
conf
DOI :
10.1109/NSSMIC.2007.4436422
Filename :
4436422
Link To Document :
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