DocumentCode :
469549
Title :
Integrated tests of a high speed VXS switch card and 250 MSPS flash ADCs
Author :
Dong, H. ; Cuevas, C. ; Curry, D. ; Jastrzembski, E. ; Barbosa, F. ; Wilson, J. ; Taylor, M. ; Raydo, B.
Author_Institution :
Jefferson Lab, Newport
Volume :
1
fYear :
2007
fDate :
Oct. 26 2007-Nov. 3 2007
Firstpage :
831
Lastpage :
833
Abstract :
High trigger rate nuclear physics experiments proposed for the 12 GeV upgrade at the Thomas Jefferson National Accelerator Facility create a need for new high speed digital systems for energy summing. Signals from electronic detectors will be captured with the Jefferson Lab FADC module, which collects and processes data from 16 charged particle sensors with 10 or 12 bit resolution at 250 MHz sample rate. Up to sixteen FADC modules transfer energy information to a central energy summing module for each readout crate. The sums from the crates are combined to form a global energy sum that is used to trigger data readout for all modules. The Energy Sum module and FADC modules have been designed using the VITA-41 VME64 switched serial (VXS) standard. The VITA- 41 standard defines payload and switch slot module functions, and offers an elegant engineered solution for Multi-Gigabit serial transmission on a standard VITA-41 backplane. The Jefferson Lab Energy Sum module receives data serially at a rate of up to 6 Giga-bits per second from the FADC modules. Both FADC and Energy Sum modules have been designed and assembled and this paper describes the integrated tests using both high speed modules in unison.
Keywords :
nuclear electronics; readout electronics; Jefferson Lab Energy Sum module; Jefferson Lab FADC module; VITA-41 VME64 switched serial standard; electronic detector signals; flash ADC; global energy sum; high speed VXS switch card; Detectors; Digital systems; Energy resolution; Nuclear electronics; Nuclear physics; Particle accelerators; Signal detection; Signal processing; Switches; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2007. NSS '07. IEEE
Conference_Location :
Honolulu, HI
ISSN :
1095-7863
Print_ISBN :
978-1-4244-0922-8
Electronic_ISBN :
1095-7863
Type :
conf
DOI :
10.1109/NSSMIC.2007.4436457
Filename :
4436457
Link To Document :
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