Radiation hard sensors for the beam calorimeter of the ILC

Author

Grah, Christian ; Afanaciev, K. ; Bernitt, P. ; Chelkov, G. ; Gajewski, J. ; Heller, R. ; Henschel, H. ; Ignatenko, A. ; Krumshteyn, Z. ; Kulis, S. ; Lange, W. ; Lohmann, W. ; Ohlerich, M. ; Rosco, A. ; Sapronov, A. ; Schmidt, R. ; Schuwalow, S.

Author_Institution

Deutsches Elektronen-Synchrotron, Zeuthen

Volume

3

fYear

2007

fDate

Oct. 26 2007-Nov. 3 2007

Firstpage

2281

Lastpage

2284

Abstract

The beam calorimeter in the forward region of the ILC detectors will be hit by a large amount of electron-positron pairs originating from beamstrahlung, a new phenomenon at the ILC. The by ionization deposited energy in the BeamCal sensor planes can be as high as 10 MGy per year of operation. The FCAL collaboration investigates different alternatives as possible sensor materials: polycrystalline and single crystal CVD diamond and GaAs. The investigation of these materials includes the measurement of the charge collection distance and the radiation hardness against irradiation with 10 MeV electrons in a test beam to doses of several MGy.

Keywords

III-V semiconductors; chemical vapour deposition; diamond; dosimetry; electron beam effects; elemental semiconductors; gallium arsenide; particle calorimetry; radiation hardening; semiconductor counters; BeamCal sensor planes; C; FCAL collaboration; GaAs; ILC; beam calorimeter; beamstrahlung; charge collection distance measurement; electron irradiation; electron-positron pairs; ionization deposited energy; polycrystalline materials; radiation dose; radiation hard sensors; radiation hardness; single crystal CVD diamond; Charge measurement; Collaboration; Crystalline materials; Current measurement; Electron beams; Gallium arsenide; Ionization; Ionizing radiation sensors; Materials testing; Sensor phenomena and characterization; CCD; CVD diamond; GaAs; ILC; beam calorimeter; beamstrahlung; irradiation; radiation hardness;

fLanguage

English

Publisher

ieee

Conference_Titel

Nuclear Science Symposium Conference Record, 2007. NSS '07. IEEE

Conference_Location

Honolulu, HI

ISSN

1095-7863

Print_ISBN

978-1-4244-0922-8

Electronic_ISBN

1095-7863

Type

conf

DOI

10.1109/NSSMIC.2007.4436601

Filename

4436601