DocumentCode
469937
Title
Performance evaluate of carbon-interspaced and aluminum-interspaced antiscatter grids based upon the IEC standard fixture
Author
Kim, K.Y. ; Oh, J.E. ; Lee, S.Y. ; Choi, S.I. ; Cho, H.S. ; Kim, J.S. ; Chung, N.G. ; Kim, J.W. ; Kim, J.G.
Author_Institution
Dept. of Radiol. Sci., Yonsei Univ., Wonju
Volume
2
fYear
2007
fDate
Oct. 26 2007-Nov. 3 2007
Firstpage
1222
Lastpage
1226
Abstract
Recently, we have successfully developed very precise carbon-interspaced antiscatter grids by adopting the sawing process used in the semiconductor industry, in order to employ them to digital radiographic (DR) systems. For the systematic performance evaluate, we prepared 12 carbon-interspaced sample grids with strip densities in the range of 40-85 lines/cm for a fixed grid ratio of 5:1 and with grid ratios in the range of 5:1-10:1, in turn, for a fixed strip density of 80 lines/cm and established a well-controlled test condition based upon the IEC standard. For comparison, we also prepared 6 additional aluminum-interspaced sample grids, which were fabricated by using the conventional method, with the same geometrical parameters. In this paper, we presented the performance characteristics of the prepared sample grids with both experimental measurements and calculations in terms of the transmission of primary radiation (Tp), the transmission of scattered radiation (Ts), the transmission of total radiation (Tt), the selectivity (Sigma), the contrast improvement factor (Cif), and the Bucky factor (B). We also described the line artifacts which were easily found in the use of grids in DR imaging systems and proposed possible solutions to overcome these difficulties effectively.
Keywords
IEC standards; X-ray imaging; aluminium; carbon; image enhancement; performance evaluation; radiography; Al; Bucky factor; C; IEC standard fixture; aluminum interspacing; antiscatter grids; carbon interspacing; contrast improvement factor; digital radiography; Electronics industry; Fixtures; IEC standards; Radiography; Research and development; Sawing; Scattering; Strips; System testing; Telephony;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record, 2007. NSS '07. IEEE
Conference_Location
Honolulu, HI
ISSN
1095-7863
Print_ISBN
978-1-4244-0922-8
Electronic_ISBN
1095-7863
Type
conf
DOI
10.1109/NSSMIC.2007.4437225
Filename
4437225
Link To Document