Title :
Examination of the utility of commercial-off-the-shelf memory devices as X-ray detectors
Author :
Fullem, Travis Z. ; Lehman, Lawrence P. ; Cotts, Eric J.
Author_Institution :
State Univ. of New York at Binghamton, Binghamton
fDate :
Oct. 26 2007-Nov. 3 2007
Abstract :
An examination was conducted of the use of standard memory devices as X-ray detectors. Commercial-off- the-shelf memory devices such as flash memory, UV-EPROM, DRAM, and non-volatile SRAM units were studied. The memory states of the devices were continuously monitored as a function of time and X-ray flux. It was found that in all configurations used, the devices were not practical X-Ray dosimeters; hard fails were nearly as prevalent as soft fails.
Keywords :
X-ray detection; digital storage; dosimeters; nuclear electronics; DRAM; UV-EPROM; X-ray detectors; X-ray dosimeters; X-ray flux; commercial-off-the-shelf memory devices; flash memory; nonvolatile SRAM units; DRAM chips; EPROM; Electrons; Flash memory; Nonvolatile memory; Random access memory; Silicon; Single event upset; X-ray detection; X-ray detectors;
Conference_Titel :
Nuclear Science Symposium Conference Record, 2007. NSS '07. IEEE
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4244-0922-8
Electronic_ISBN :
1095-7863
DOI :
10.1109/NSSMIC.2007.4437245
