DocumentCode :
469986
Title :
Experimental results of a 7-channel spectroscopy detector module with mega-count rate capability
Author :
Reckleben, C. ; Hansen, K. ; Diehl, I. ; Klär, H. ; Welter, E.
Author_Institution :
Deutsches Elektronen-Synchrotron (DESY), Hamburg
Volume :
2
fYear :
2007
fDate :
Oct. 26 2007-Nov. 3 2007
Firstpage :
1595
Lastpage :
1597
Abstract :
A compact detector module based on Si-drift detectors with integrated junction-field effect transistors has been developed. It has been set up for X-ray absorption spectroscopy and X-ray standing-wave technique, and is usable in vacuum environment. The modules´ hexagonal shape with a wrench size of 16 mm allows small distances to the samples and a compact multi-module arrangement. The monolithic 7-cell sensor has an active area of ~50 mm2 and a thickness of 450 mum. It provides a spectral resolution of some hundred eV in the soft X-ray regime at room temperature. A fully differential 7-channel BiCMOS readout chip has been developed to process the detector signals at a power dissipation of 15 mW per channel. First spectral measurements with energies up to 43 keV have been performed with the prototype module. A rate-dependent energy-peak shift remains below 3% at integral photon- count rates of more than 6 Mcts/s. The deviation from the linear regression is within plusmn2% in the energy range between 6 and 20 keV. The on-chip gain variations are below 3.4%.
Keywords :
BiCMOS integrated circuits; X-ray absorption spectra; junction gate field effect transistors; nuclear electronics; readout electronics; silicon radiation detectors; 7-channel spectroscopy detector module; X-ray absorption spectroscopy; X-ray standing-wave technique; compact multimodule arrangement; fully differential 7-channel BiCMOS readout chip; integral photon-count rates; integrated junction-field effect transistors; linear regression; mega-count rate capability; monolithic 7-cell Si-drift detectors; on-chip gain variations; power dissipation; prototype module; room temperature; soft X-ray regime; spectral resolution; temperature 293 K to 298 K; vacuum environment; BiCMOS integrated circuits; Detectors; Electromagnetic wave absorption; Shape; Signal detection; Signal processing; Signal resolution; Spectroscopy; Temperature sensors; Vacuum technology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2007. NSS '07. IEEE
Conference_Location :
Honolulu, HI
ISSN :
1095-7863
Print_ISBN :
978-1-4244-0922-8
Electronic_ISBN :
1095-7863
Type :
conf
DOI :
10.1109/NSSMIC.2007.4437303
Filename :
4437303
Link To Document :
بازگشت