DocumentCode :
4701
Title :
High-Resolution, Low-Noise Imaging in THz Polaritonics
Author :
Werley, C.A. ; Teo, S.M. ; Ofori-Okai, B.K. ; Sivarajah, P. ; Nelson, K.A.
Author_Institution :
Massachusetts Inst. of Technol. (MIT), Cambridge, MA, USA
Volume :
3
Issue :
3
fYear :
2013
fDate :
May-13
Firstpage :
239
Lastpage :
247
Abstract :
Time-resolved imaging of propagating electromagnetic waves at terahertz (THz) frequencies provides deep insights into waves and their interaction with a variety of photonic elements. As new components for THz control are developed, such as metamaterial microstructures that display deep sub-wavelength E-field localization, finer spatial resolution and more sensitive imaging techniques are required to study them. Here we introduce key advances in the optical design and lock-in image acquisition at 500 Hz for the complementary imaging techniques of phase contrast and polarization gating. Compared to other methods, this leads to a 4-fold improvement in resolution and up to 5-fold reduction in noise through suppression of low frequency laser fluctuations. With a resolution better than 1.5 μm (λ/100 at 0.5 THz) and a noise floor of 0.2%, phase contrast imaging presents new opportunities for studying very fine structures and near-fields in the THz regime. For most other experiments, polarization gating imaging is preferred because its noise floor is lower at 0.12% and its <; 5 μm resolution is typically more than sufficient.
Keywords :
optical design techniques; polaritons; terahertz wave imaging; E-field localization; THz polaritonics; frequency 500 Hz; high resolution imaging; lock in image acquisition; low frequency laser fluctuation; low noise imaging; metamaterial microstructure; optical design; phase contrast; polarization gating; spatial resolution; time resolved imaging; Electromagnetic propagation in dispersive media; far-fields; near-fields; signal detection; terahertz (THz) imaging;
fLanguage :
English
Journal_Title :
Terahertz Science and Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
2156-342X
Type :
jour
DOI :
10.1109/TTHZ.2013.2250580
Filename :
6492161
Link To Document :
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