DocumentCode :
471176
Title :
Finding the Incidence Angle for Rays Refracted Through Multiple Dielectric Layers
Author :
Ahmed, Y. ; Hao, Yuwen
Author_Institution :
London Univ., London
fYear :
2007
fDate :
11-16 Nov. 2007
Firstpage :
1
Lastpage :
3
Abstract :
In this paper we propose a technique for finding the exact angle that a ray must be transmitted in order to arrive at a particular location after refracting through a dielectric medium. The technique is initially developed for a single dielectric medium but is shown to be applicable to multiple dielectric media with various widths and permittivities. Simulation results have shown that the proposed technique performs better than the existing techniques for low loss dielectrics and for certain incidence angles.
Keywords :
dielectric materials; electromagnetic wave refraction; dielectric medium; multiple dielectric layers; rays incidence angle; Ray Tracing; Reflection; Refraction; Snell´s Law; Wave Propagation;
fLanguage :
English
Publisher :
iet
Conference_Titel :
Antennas and Propagation, 2007. EuCAP 2007. The Second European Conference on
Conference_Location :
Edinburgh
Print_ISBN :
978-0-86341-842-6
Type :
conf
Filename :
4458917
Link To Document :
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