Title :
Procedure and Process Optimization for Reduction of Measurement Uncertainties in RF Test Facilities
Author_Institution :
Astrium GmbH, Munich
Abstract :
The measurement accuracy of state-of-the-art RF test facilities like near-field or compact test ranges is influenced due to applied system hardware as well as operational facts which are influenced by human errors. The measurement errors of near-field test facilities were analyzed and published in the past times and are based on the 18-term error model of Newell [1]. For compact test ranges and especially for the cross-polar free compensated compact range a similar error model was established at Astrium GmbH within a study for the satellite service provider INTELSAT [2] in order to define possible facility performance improvements and maximum achievable values for the measurement accuracy. It has to be remarked, that test programs for space applications require very stringent adherence to procedures and documentation of process steps during a test campaign. Within this paper, recommendations for process optimizations and procedures will be presented to guarantee the adherence to the valid error budgets and to minimize the human factor. A description of main error contributions in the compensated compact range (CCR) of Astrium GmbH will be performed. Furthermore, the error budgets for pattern and gain measurements and achievable performance improvements will be given.
Keywords :
antenna testing; human factors; optimisation; satellite antennas; satellite communication; Astrium GmbH; antenna measurements; compact test ranges; cross-polar free compensated compact range; human factor; measurement uncertainty reduction; near-field test facilities; optimization process; satellite service provider INTELSAT; state-of-the-art RF test facilities; system hardware; Antenna Measurements; Compact Range; Error Budgets; Range Procedures;
Conference_Titel :
Antennas and Propagation, 2007. EuCAP 2007. The Second European Conference on
Conference_Location :
Edinburgh
Print_ISBN :
978-0-86341-842-6