DocumentCode :
471462
Title :
Auto-Calibrated Dynamic Parallel MRI with Phase-Sensitive Data
Author :
Son, Jong Bum ; Ji, Jim X.
Author_Institution :
Dept. of Electr. & Comput. Eng., Texas A&M Univ., College Station, TX
fYear :
2006
fDate :
Aug. 30 2006-Sept. 3 2006
Firstpage :
751
Lastpage :
754
Abstract :
A number of MRI applications rely on dynamic phase information embedded in the acquired images. Such applications often require multiple acquisitions, leading to possibly long scan time and low temporal resolution. Previously, SENSE method has been used for phase-sensitive data to shorten acquisition time. However, SENSE can be subject to artifacts due to inaccurate coil sensitivities and low SNR. In this paper, dynamic phase data are derived from self-calibrated parallel MRI and an optimal method is used to combine phase information from multiple receiver channels. Simulation results using 4-channel prostate imaging data show that it is possible to get a factor of 3 speedup and the new method is more accurate than the SENSE method in reconstructing the phase information, thus has potential to improve phase-sensitive MRI applications such as phase contrast velocity mapping, temperature mapping for thermal therapy, and Dixon water/fat imaging
Keywords :
biological organs; biomedical MRI; image reconstruction; medical image processing; Dixon water-fat imaging; auto-calibrated dynamic parallel MRI; dynamic phase information; image reconstruction; multiple receiver channels; optimal method; phase contrast velocity mapping; phase-sensitive data; prostate imaging data; temperature mapping; thermal therapy; Application software; Calibration; Cities and towns; Coils; Image reconstruction; Interpolation; Magnetic resonance imaging; Medical treatment; Temperature sensors; USA Councils; Parallel MRI; image reconstruction; phase sensitive MRI; phase-contrast MRA; temperature mapping;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
Conference_Location :
New York, NY
ISSN :
1557-170X
Print_ISBN :
1-4244-0032-5
Electronic_ISBN :
1557-170X
Type :
conf
DOI :
10.1109/IEMBS.2006.260695
Filename :
4461860
Link To Document :
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