• DocumentCode
    471496
  • Title

    Functional Feature Embedded Space Mapping of fMRI data

  • Author

    Hu, Jin ; Tian, Jie ; Yang, Lei

  • Author_Institution
    Med. Image Proccess. Group, Chinese Acad. of Sci., Beijing
  • fYear
    2006
  • fDate
    Aug. 30 2006-Sept. 3 2006
  • Firstpage
    1014
  • Lastpage
    1017
  • Abstract
    We have proposed a new method for fMRI data analysis which is called Functional Feature Embedded Space Mapping (FFESM). Our work mainly focuses on the experimental design with periodic stimuli which can be described by a number of Fourier coefficients in the frequency domain. A nonlinear dimension reduction technique Isomap is applied to the high dimensional features obtained from frequency domain of the fMRI data for the first time. Finally, the presence of activated time series is identified by the clustering method in which the information theoretic criterion of minimum description length (MDL) is used to estimate the number of clusters. The feasibility of our algorithm is demonstrated by real human experiments. Although we focus on analyzing periodic fMRI data, the approach can be extended to analyze non-periodic fMRI data (event-related fMRI) by replacing the Fourier analysis with a wavelet analysis
  • Keywords
    Fourier analysis; biomedical MRI; time series; FFESM; Fourier analysis; Fourier coefficient; Fuzzy c-means clustering; MDL; event-related fMRI; functional feature embedded space mapping; minimum description length; nonlinear dimension reduction technique; time series; wavelet analysis; Clustering methods; Data analysis; Delay; Design for experiments; Discrete Fourier transforms; Discrete wavelet transforms; Feature extraction; Frequency domain analysis; Laplace equations; Magnetic field measurement; Functional Feature Embedded Space Mapping (FFESM); Fuzzy c-means clustering; Isomap; fMRI;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
  • Conference_Location
    New York, NY
  • ISSN
    1557-170X
  • Print_ISBN
    1-4244-0032-5
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/IEMBS.2006.260560
  • Filename
    4461926