• DocumentCode
    471582
  • Title

    Feature Extraction and Subset Selection for Classifying Single-Trial ECoG during Motor Imagery

  • Author

    Wei, Qingguo ; Gao, Xiaorong ; Gao, Shangkai

  • Author_Institution
    Dept. of Electron. Eng., Nanchang Univ.
  • fYear
    2006
  • fDate
    Aug. 30 2006-Sept. 3 2006
  • Firstpage
    1589
  • Lastpage
    1592
  • Abstract
    The electrocorticogram (ECoG) recorded from subdural electrodes is a kind of BCI signal source that has the potential to achieve good classification results. The feature extraction and its subset selection are crucial for increasing classification accuracy rate. This paper proposes a new algorithm for classifying single-trial ECoG during motor imagery. The nonlinear regressive coefficients between signals on 10 leads are extracted in two frequency bands 0-3 Hz and 8-30 Hz as classification features. A genetic algorithm is used for the selection of the optimal feature subset and a support vector machine for their evaluation. The generalization error of 7% is achieved on data set I of BCI Competition III
  • Keywords
    bioelectric phenomena; biomedical electrodes; feature extraction; genetic algorithms; learning (artificial intelligence); medical signal processing; regression analysis; support vector machines; user interfaces; 0 to 3 Hz; 8 to 30 Hz; BCI signal; brain-computer interface; electrocorticogram; feature extraction; genetic algorithm; motor imagery; nonlinear regressive coefficient; single-trial ECoG classification; subdural electrodes; subset selection; support vector machine; Biomedical engineering; Data mining; Feature extraction; Fingers; Frequency; Genetic algorithms; Materials requirements planning; Support vector machine classification; Support vector machines; Tongue; brain-computer interface; electrocorticogram; genetic algorithm; nonlinear regression;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
  • Conference_Location
    New York, NY
  • ISSN
    1557-170X
  • Print_ISBN
    1-4244-0032-5
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/IEMBS.2006.260561
  • Filename
    4462070