DocumentCode
471635
Title
Development of a Finger Joint Phantom for Evaluation of Frequency Domain Measurement Systems
Author
Netz, Uwe J. ; Scheel, Alexander K. ; Beuthan, Jurgen ; Hielscher, Andreas H.
Author_Institution
Inst. fur Medizinische Phys. & Lasermedizin, Charite-Universitatsmedizin Berlin
fYear
2006
fDate
Aug. 30 2006-Sept. 3 2006
Firstpage
1937
Lastpage
1940
Abstract
For development and test of new optical imaging devices, phantoms are widely used to emulate the tissue to be imaged. Phantom design gets more difficult the more complex the tissue is structured. We report on developing and testing a solid, stable finger joint phantom to simulate transillumination of finger joints in frequency-domain imaging systems. The phantom consists of the bone, capsule, skin, the capsule volume, and the joint gap. Silicone was used to build the solid parts and a glycerol-water solution for the fluid in the capsule volume and joint gap. The system to test the phantom is an optical frequency-domain scanning set-up. Different stages of joint inflammation as they occur in rheumatoid arthritis (BA) were emulated by assembling the phantom with capsule and fluid having different optical properties. Reliability of the phantom measurement was investigated by repeated assembling. The results show clear discrimination between different stages of joints within the signal deviation due to reassembling of the phantom
Keywords
biomedical optical imaging; bone; diseases; frequency-domain analysis; phantoms; skin; biological tissue; bone; capsule; finger joint phantom; frequency domain measurement system; frequency-domain imaging system; glycerol-water solution; joint inflammation; optical frequency-domain scanning set-up; optical imaging device; rheumatoid arthritis; skin; Assembly; Bones; Fingers; Frequency domain analysis; Frequency measurement; Imaging phantoms; Joints; Optical imaging; Solid modeling; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
Conference_Location
New York, NY
ISSN
1557-170X
Print_ISBN
1-4244-0032-5
Electronic_ISBN
1557-170X
Type
conf
DOI
10.1109/IEMBS.2006.259302
Filename
4462159
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