DocumentCode :
471718
Title :
Estimates of Endocardial Potentials from Non-contact Intracavitary Probes
Author :
Throne, Robert ; Olson, Lorraine ; Windle, John ; Schweitzer, Jeff ; Voth, Eric
Author_Institution :
Dept. of Electr. Eng., Rose-Hulman Inst. of Technol., Terre Haute, IN
fYear :
2006
fDate :
Aug. 30 2006-Sept. 3 2006
Firstpage :
2560
Lastpage :
2563
Abstract :
The EnSitetrade intracavitary probe system developed by Endocardial Solutions, Inc (St. Jude Medical, St. Paul, MN) was used to simultaneously record geometric information, probe potentials, and selected endocardial potentials within the right atria for four patients. Tikhonov regularization was then used to estimate endocardial potentials from probe measurements for each patient at each endocardial site. The correlation coefficients and relative errors between the estimated potentials and the measured endocardial potentials were then calculated. This inverse problem was quite ill-conditioned, and first-order Tikhonov regularization performed better than zero-order or second-order Tikhonov regularization in producing stable and accurate results. In choosing the regularization parameter mu, a constant value of mu=0.3 performed as well as CRESO and maximum curvature, which pick a different mu for each time instant
Keywords :
bioelectric potentials; biomedical equipment; biomedical measurement; cardiology; correlation methods; inverse problems; probes; EnSite intracavitary probe system; Endocardial Solutions; composite residual error; correlation coefficients; endocardial potential estimation; first-order Tikhonov regularization; inverse problem; noncontact intracavitary probes; relative errors; right atria; smoothing operator; Catheters; Electric potential; Electric variables measurement; Finite element methods; Geometry; Heart; Inverse problems; Laplace equations; Medical diagnostic imaging; Probes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
Conference_Location :
New York, NY
ISSN :
1557-170X
Print_ISBN :
1-4244-0032-5
Electronic_ISBN :
1557-170X
Type :
conf
DOI :
10.1109/IEMBS.2006.260545
Filename :
4462318
Link To Document :
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