• DocumentCode
    471785
  • Title

    New Deformable Registration Technique Using Scale Space and Curve Evolution Theory and A Finite Element Based Validation Framework

  • Author

    Fahmi, Rachid ; Aly, Alaa ; Elbaz, Ayman ; Farag, Aly A.

  • Author_Institution
    Comput. Vision & Image Process. Lab., Louisville Univ., KY
  • fYear
    2006
  • fDate
    Aug. 30 2006-Sept. 3 2006
  • Firstpage
    3041
  • Lastpage
    3044
  • Abstract
    In this paper, we present a novel and accurate approach for nonrigid registration. New feature descriptors are built as voxel signatures using scale space theory. These descriptors are used to capture the global motion of the imaged object. Local deformations are modelled through an evolution process of equi-spaced closed curves/surfaces (iso-contours/surfaces) which are generated using fast marching level sets and are matched using the built feature descriptors. The performance of the proposed approach is validated using the finite element method. Both 2D and 3D tissue deformations cases are simulated, and the registration accuracy is quantified by co-registering the deformed images with the original ones and comparing the recovered mesh point displacements with the simulated ones. The evaluation results show the potential of the proposed approach in handling local deformation better than some conventional approaches
  • Keywords
    biological tissues; biomedical MRI; finite element analysis; image matching; image registration; medical image processing; MRI; curve evolution theory; deformable registration technique; fast marching level sets; finite element method; nonrigid registration approach; registration accuracy; scale space theory; tissue deformations; voxel signatures; Anatomy; Brain modeling; Cities and towns; Deformable models; Finite element methods; Image edge detection; Level set; Robustness; Spline; USA Councils;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
  • Conference_Location
    New York, NY
  • ISSN
    1557-170X
  • Print_ISBN
    1-4244-0032-5
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/IEMBS.2006.259739
  • Filename
    4462438