DocumentCode
471881
Title
Magnetic Field Mapping by Selective Equipotential Excitation
Author
Felfoul, Ouajdi ; Raimbert, Michelle ; Martel, Sylvain
Author_Institution
Dept. of Comput. Eng., Ecole Polytech. de Montreal, Que.
fYear
2006
fDate
Aug. 30 2006-Sept. 3 2006
Firstpage
3775
Lastpage
3778
Abstract
A new magnetic field mapping method in MRI is presented. This technique is ideal for severe inhomogeneities where plane warp cannot be ignored. The present study employs a ferromagnetic ball to create a perturbation within the imaged volume. The magnetic moment and position of the device are acquired experimentally with a new technique that excites magnetic equipotentials within a volume. A three dimensional perturbation field is then reconstructed from which an accurate field map is acquired for any slice within the volume. This method is compared with phase imaging, which is commonly used to map the magnetic field perturbation. Preliminary investigations show that this method is accurate and provides field maps that do not suffer from distortion in the slice select and read direction. This method can help in the correction of susceptibility artifacts by providing an accurate map of the perturbing field generated by magnetic markers on medical instruments
Keywords
biomedical MRI; image reconstruction; magnetic moments; perturbation techniques; MRI; ferromagnetic ball; magnetic equipotentials; magnetic field mapping method; magnetic markers; magnetic moment; medical instruments; plane warp; selective equipotential excitation; susceptibility artifact correction; three dimensional perturbation field; Biomedical engineering; Cities and towns; Equations; Image reconstruction; Implants; Magnetic fields; Magnetic moments; Magnetic resonance imaging; Magnetic susceptibility; Shape; MRI; ferromagnetic; field map; magnetic inhomogeneity; plane warp; susceptibility artifacts;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
Conference_Location
New York, NY
ISSN
1557-170X
Print_ISBN
1-4244-0032-5
Electronic_ISBN
1557-170X
Type
conf
DOI
10.1109/IEMBS.2006.260054
Filename
4462621
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