DocumentCode :
471881
Title :
Magnetic Field Mapping by Selective Equipotential Excitation
Author :
Felfoul, Ouajdi ; Raimbert, Michelle ; Martel, Sylvain
Author_Institution :
Dept. of Comput. Eng., Ecole Polytech. de Montreal, Que.
fYear :
2006
fDate :
Aug. 30 2006-Sept. 3 2006
Firstpage :
3775
Lastpage :
3778
Abstract :
A new magnetic field mapping method in MRI is presented. This technique is ideal for severe inhomogeneities where plane warp cannot be ignored. The present study employs a ferromagnetic ball to create a perturbation within the imaged volume. The magnetic moment and position of the device are acquired experimentally with a new technique that excites magnetic equipotentials within a volume. A three dimensional perturbation field is then reconstructed from which an accurate field map is acquired for any slice within the volume. This method is compared with phase imaging, which is commonly used to map the magnetic field perturbation. Preliminary investigations show that this method is accurate and provides field maps that do not suffer from distortion in the slice select and read direction. This method can help in the correction of susceptibility artifacts by providing an accurate map of the perturbing field generated by magnetic markers on medical instruments
Keywords :
biomedical MRI; image reconstruction; magnetic moments; perturbation techniques; MRI; ferromagnetic ball; magnetic equipotentials; magnetic field mapping method; magnetic markers; magnetic moment; medical instruments; plane warp; selective equipotential excitation; susceptibility artifact correction; three dimensional perturbation field; Biomedical engineering; Cities and towns; Equations; Image reconstruction; Implants; Magnetic fields; Magnetic moments; Magnetic resonance imaging; Magnetic susceptibility; Shape; MRI; ferromagnetic; field map; magnetic inhomogeneity; plane warp; susceptibility artifacts;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
Conference_Location :
New York, NY
ISSN :
1557-170X
Print_ISBN :
1-4244-0032-5
Electronic_ISBN :
1557-170X
Type :
conf
DOI :
10.1109/IEMBS.2006.260054
Filename :
4462621
Link To Document :
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