DocumentCode
471883
Title
A new scheme and reconstruction algorithm for dual source circular CT
Author
Yan, Ming ; Zhang, Cishen ; Liang, Hongzhu
Author_Institution
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ.
fYear
2006
fDate
Aug. 30 2006-Sept. 3 2006
Firstpage
3783
Lastpage
3786
Abstract
Circular cone beam scanning has been a most popular scheme for computed tomography (CT) imaging, which is simple and can achieve symmetric projection data of the interested object. Many algorithms have been developed for circular cone beam CT. Many of these are FDK type algorithms, which can achieve good reconstruction quality when cone angle is small but may cause image deformation and density reduction at off plane when the cone angle is large. With the recently introduced dual source circular cone beam CT, we can deal with this problem under a new dual source geometry. In this paper, we propose a novel reconstruction scheme dual source circular cone beam CT by placing X-ray sources on two circular planes perpendicular to the rotating axis. We propose a reconstruction algorithm for this scanning scheme and evaluate the scanning scheme and the reconstruction algorithm with a 3D Shepp Logan phantom and a disk phantom. Simulation results show that the proposed method can provide improved reconstruction image quality for both in plane and off plane of the object
Keywords
computerised tomography; image reconstruction; medical image processing; phantoms; 3D Shepp Logan phantom; FDK algorithm; X-ray source; circular cone beam scanning; computed tomography; disk phantom; dual source circular cone beam CT; image quality; reconstruction algorithm; symmetric projection data; Biomedical engineering; Chemical technology; Computed tomography; Detectors; Geometry; Image quality; Image reconstruction; Imaging phantoms; Reconstruction algorithms; X-ray imaging; Dual source CT; FDK algorithm; circular cone beam CT;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
Conference_Location
New York, NY
ISSN
1557-170X
Print_ISBN
1-4244-0032-5
Electronic_ISBN
1557-170X
Type
conf
DOI
10.1109/IEMBS.2006.259787
Filename
4462623
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