DocumentCode :
471893
Title :
Statistical Evaluation of The Cleft Lip Nose Deformity Image
Author :
Kim, D.W. ; Kim, J.T. ; Hong, H.K. ; Nam, K.C. ; Park, J.H.
Author_Institution :
Dept. of Med. Eng., Yonsei Univ. Coll. of Medicine, Seoul
fYear :
2006
fDate :
Aug. 30 2006-Sept. 3 2006
Firstpage :
3840
Lastpage :
3842
Abstract :
Cleft lip is a congenital deformity condition with separation of the two sides of the lip and causes nose deformity. Evaluation of surgical corrections and assessment of prognosis in nose deformity depend mainly on doctor´s subjective judgment. Development of an objective assessment tool in evaluation of the cleft lip nose deformity patients will help in advancement and evaluation of surgical techniques. Therefore, our study aimed on quantitative assessment of a cleft lip nose deformity by comparing following parameters gathered from a photographic image of a cleft lip patient: (1) angle difference between two nostril axes, (2) center of the nostril and distance between two centers, (3) overlapped area of two nostrils and (4) the overlapped area ratio of two nostrils. Assessment results of the nose deformity were statistically analyzed with evaluation results from three highly experienced plastic surgeons. In addition, regression model was developed using correlation relationship and factor analysis of parameters from the results of image analysis
Keywords :
medical image processing; regression analysis; surgery; cleft lip nose deformity image; congenital deformity; correlation relationship; factor analysis; image analysis; nostril angle difference; nostril center; overlapped area; photographic image; plastic surgeon; prognosis assessment; regression model; statistical evaluation; surgical correction; Biomedical engineering; Biomedical imaging; Birth disorders; Cities and towns; Educational institutions; Image analysis; Medical diagnostic imaging; Nose; Surgery; USA Councils; Cleft lip; nose deformity; nostril;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
Conference_Location :
New York, NY
ISSN :
1557-170X
Print_ISBN :
1-4244-0032-5
Electronic_ISBN :
1557-170X
Type :
conf
DOI :
10.1109/IEMBS.2006.260429
Filename :
4462637
Link To Document :
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