Title :
Temporal Resolution of Stimulation Threshold: A Tool for Electrophysiologic Analysis
Author :
Whittington, R. Hollis ; Chen, Michael Q. ; Giovangrandi, Laurent ; Kovacs, Gregory T A
Author_Institution :
Dept. of Electr. Eng., Stanford Univ., CA
fDate :
Aug. 30 2006-Sept. 3 2006
Abstract :
Electrical stimulation of cardiac cultures with closed-loop control permits the determination of threshold in real time. The temporal response of stimulation threshold and underlying cell membrane excitability is valuable information for understanding the complex electrophysiologic processes within cardiac cells and can aid in understanding the mechanisms and effects of pharmaceuticals or other stimuli. This work presents the temporal response of stimulation threshold measured using HL-1 cardiac myocytes when exposed to changes in temperature and extracellular potassium concentration. These changes mimic systemic alteration of excitability and conditions that can result from ischemia in the heart. The results demonstrate the efficacy of stimulation threshold as a physiologic indicator and illustrate transient effects with both fast and slow time constants that can be resolved using a system that determines stimulation threshold in real time
Keywords :
bioelectric phenomena; biomedical electrodes; biomembrane transport; cardiology; closed loop systems; drugs; medical control systems; microelectrodes; potassium; HL-1 cardiac myocytes; cardiac cells; cardiac culture; cell membrane excitability; closed-loop control; electrical stimulation threshold; electrophysiologic analysis; extracellular potassium concentration; ischemia; microelectrode arrays; pharmaceuticals; temporal resolution; temporal response; transient effects; Biomembranes; Cardiology; Cells (biology); Electric variables measurement; Electrical stimulation; Electrophysiology; Extracellular; Microelectrodes; Pulse measurements; Time measurement;
Conference_Titel :
Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
Conference_Location :
New York, NY
Print_ISBN :
1-4244-0032-5
Electronic_ISBN :
1557-170X
DOI :
10.1109/IEMBS.2006.259332