Title :
Syndrome-Based Discrimination of Single Nucleotide Polymorphism
Author :
May, E.E. ; Dolan, P. ; Crozier, P. ; Brozik, S.
Author_Institution :
Comput. Biol. Dept., Sandia Nat. Labs., Albuquerque, NM
fDate :
Aug. 30 2006-Sept. 3 2006
Abstract :
The ability to discriminate nucleic acid sequences is necessary for a wide variety of applications: high throughput screening, distinguishing genetically modified organisms (GMOs), molecular computing, differentiating biological markers, fingerprinting a specific sensor response for complex systems, etc. Hybridization-based target recognition and discrimination is central to the operation of nucleic acid sensor systems. Therefore developing a quantitative correlation between mishybridization events and sensor out put is critical to the accurate interpretation of results. In this work, using experimental data produced by introducing single mutations (single nucleotide polymorphisms, SNPs) in the probe sequence of computational catalytic molecular beacons (deoxyribozyme gates) [1], we investigate coding theory algorithms for uniquely categorizing SNPs based on the calculation of syndromes
Keywords :
DNA; biochemistry; biology computing; biosensors; genetics; molecular biophysics; proteins; DNA sensors; biological markers; coding theory algorithms; computational catalytic molecular beacons; deoxyribozyme gates; fingerprinting; genetically modified organism; hybridization-based target recognition; molecular computing; nucleic acid sensor system; nucleic acid sequence; nucleotide-based sensor system; probe sequence; single mutation; single nucleotide polymorphism; syndrome-based discrimination; Biomarkers; Biosensors; Fingerprint recognition; Genetic mutations; Molecular computing; Organisms; Sensor systems; Sensor systems and applications; Target recognition; Throughput; DNA sensors; SNP; coding theory; hybridization; single nucleotide polymorphism;
Conference_Titel :
Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
Conference_Location :
New York, NY
Print_ISBN :
1-4244-0032-5
Electronic_ISBN :
1557-170X
DOI :
10.1109/IEMBS.2006.260747